Soft Error Mechanisms, Modeling and Mitigation (Hardcover, 1st ed. 2016)

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Release date:	March 2016
First published:	2016
Authors:	Selahattin Sayil
Dimensions:	235 x 155 x 8mm (L x W x T)
Format:	Hardcover
Pages:	105
Edition:	1st ed. 2016
ISBN-13:	978-3-319-30606-3
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General Promotions
LSN:	3-319-30606-5
Barcode:	9783319306063

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