Advanced Characterization of Nanostructured Materials - Probing the
Structure and Dynamics with Synchrotron X-Rays and Neutrons is a
collection of chapters which review the characterization of the
structure and internal dynamics of a wide variety of nanostructured
materials using various synchrotron X-ray and neutron scattering
techniques. It is intended for graduate students and researchers
who might be interested in learning about and applying these
methods. The authors are well-known practitioners in their fields
of research who provide detailed and authoritative accounts of how
these techniques have been applied to study systems ranging from
thin films and monolayers on solid surfaces and at liquid-air,
liquid-liquid and solid-liquid interfaces; nanostructured composite
materials; battery materials, and catalytic materials. While there
have been a great many books published on nanoscience, there are
relatively few that have discussed in one volume detailed
synchrotron X-ray and neutron methods for advanced characterization
of nanomaterials in thin films, composite materials, catalytic and
battery materials and at interfaces. This book should provide an
incentive and a reference for researchers in nanomaterials for
using these techniques as a powerful way to characterize their
samples. It should also help to popularize the use of synchrotron
and neutron facilities by the nanoscience community.
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