This book provides readers with a variety of tools to address the
challenges posed by hot carrier degradation, one of today's most
complicated reliability issues in semiconductor devices. Coverage
includes an explanation of carrier transport within devices and
book-keeping of how they acquire energy ("become hot"), interaction
of an ensemble of colder and hotter carriers with defect
precursors, which eventually leads to the creation of a defect, and
a description of how these defects interact with the device,
degrading its performance.
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