Hot Carrier Degradation in Semiconductor Devices (Hardcover, 2015 ed.)

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Release date:	November 2014
First published:	2015
Editors:	Tibor Grasser
Dimensions:	235 x 155 x 34mm (L x W x T)
Format:	Hardcover
Pages:	517
Edition:	2015 ed.
ISBN-13:	978-3-319-08993-5
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
LSN:	3-319-08993-5
Barcode:	9783319089935

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