0
Your cart

Your cart is empty

Books > Science & Mathematics > Mathematics > Probability & statistics

Buy Now

Simultaneous Inference in Regression (Hardcover, New) Loot Price: R6,340
Discovery Miles 63 400
Simultaneous Inference in Regression (Hardcover, New): Wei Liu

Simultaneous Inference in Regression (Hardcover, New)

Wei Liu

Series: Chapman & Hall/CRC Monographs on Statistics and Applied Probability

 (sign in to rate)
Loot Price R6,340 Discovery Miles 63 400 | Repayment Terms: R594 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

Simultaneous confidence bands enable more intuitive and detailed inference of regression analysis than the standard inferential methods of parameter estimation and hypothesis testing. Simultaneous Inference in Regression provides a thorough overview of the construction methods and applications of simultaneous confidence bands for various inferential purposes. It supplies examples and MATLAB (R) programs that make it easy to apply the methods to your own data analysis. The MATLAB programs, along with color figures, are available for download on www.personal.soton.ac.uk/wl/mybook.html Most of the book focuses on normal-error linear regression models. The author presents simultaneous confidence bands for a simple regression line, a multiple linear regression model, and polynomial regression models. He also uses simultaneous confidence bands to assess part of a multiple linear regression model with the zero function, to compare two regression models, and to evaluate more than two regression models. The final chapter demonstrates the use of simultaneous confidence bands in generalized linear regression models, such as logistic regression models. This book shows how to employ simultaneous confidence bands to make useful inferences in regression analysis. The topics discussed can be extended to functions other than parametric regression functions, offering novel opportunities for research beyond linear regression models.

General

Imprint: Crc Press
Country of origin: United States
Series: Chapman & Hall/CRC Monographs on Statistics and Applied Probability
Release date: October 2010
First published: 2010
Authors: Wei Liu
Dimensions: 234 x 156 x 22mm (L x W x T)
Format: Hardcover
Pages: 292
Edition: New
ISBN-13: 978-1-4398-2809-0
Categories: Books > Science & Mathematics > Mathematics > Probability & statistics
Promotions
LSN: 1-4398-2809-1
Barcode: 9781439828090

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

Partners