This useful book addresses electrothermal problems in modern
VLSI systems. It discusses electrothermal phenomena and the
fundamental building blocks that electrothermal simulation
requires. The authors present three important applications of VLSI
electrothermal analysis: temperature-dependent electromigration
diagnosis, cell-level thermal placement, and temperature-driven
power and timing analysis.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!