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This book provides the readers with the full basic knowledge necessary to understand, evaluate and develop critically any ETAAS analysis. The book covers comprehensively all aspects of the theoretical principles, routine and unusual instrumentation, overlapping possibilities with other techniques and different analytical characteristics of ETAAS at an averaged intermediate/high level. This is a good topic for a text book owing to the wide analytical possibilities of ETAAS in academic and industry laboratories. The book is written by a qualified expert with 30 years' experience working on different aspects of ETAAS.The work guides the readers through an in-depth descriptive appraisal of the chemical and physical processes occurring in an ET atomiser. The work compares favourably with other books already published on this subject as this work shows an overview with some different perspectives, focusing mainly on the processes taking place during an ETAAS analysis. An ordered, rigorous and deep description is found in every chapter. The book would be adequate for undergraduate and graduate students in any course of analytical chemistry, researchers in analytical atomic spectrometry and analysts who routinely use ETAAS. Amateurs and specialists in this field will find a good support in the book.
Este trabajo se centro en el comportamiento de varias especies de interferentes y modificadores quimicos en fase solida en una plataforma de grafito. Tambien se estudio el comportamiento de los principales componentes de la matriz (aluminio y silicio) solos y junto con los modificadores y el analito (As). Asi, en la primera parte de este trabajo se estudio el comportamiento de diferentes interferentes, sulfatos y cloruros de metales alcalinos (sodio, potasio) y alcalinoterreos (calcio, magnesio y berilio), asi como, cloruro y nitrato de aluminio. Los mecanismos de descomposicion de dichas sales se elucidaron en fase condensada a diversas temperaturas. Como modificadores quimicos se estudiaron sales de torio y circonio, mientras que como principales componentes de la matriz se utilizaron los oxidos de silicio y aluminio. La localizacion del residuo solido fue posible utilizando la microscopia electronica de barrido (SEM), mientras que la identificacion de los elementos se llevo a cabo mediante espectrometria de rayos X empleando un detector de energias dispersivas. De manera similar, los compuestos solidos se identificaron por microanalisis Raman y espectrometria FT-IR.
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