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This volume contains the proceedings of the Fifth International Confer- ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni- ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R. J. Colton of the Nayal Research Lab- oratory and Dr. D. S. Simons of the National Bureau of Standards un- der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F. K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor- tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro- duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor- poration, he brought together a team of researchers including H. J. Liebl, F. G. Riidenauer, W. P. Poschenrieder and F. G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
The 3rd International Conference on Ion Formation from Organic Solids (IFOS III) was held at the University of Munster, September 16-18, 1985. The conference was attended by 60 invited scientists from all over the world. Of the 43 papers which were presented, 40 are included in these proceedings. The aim of IFOS III was to promote the exchange of results and new ideas between scientists actively working in the field of mass spectrometry of involatile materials. Various aspects of the ion formation process - realization and optimization, theoretical understanding and analytical application -were treated, as well as instrumental developments. Some emphasis was placed on recent developments in time-of-flight and Fourier transform ion cyclotron resonance mass spectrometry, and its impact on the mass spectrometry of involatile materials. The most important goal of the conference was to combine facets of the understanding of the most complex ion formation processes with the many different aspects of its analytical application. The participants came from a wide variety of different fields, including pure and applied physics and chemistry, medicine, pharmacy, and space research. Finally, on behalf of all the conference participants, I would like to thank Dr. W. Sichtermann and: \1iss I. Bekemeier for the perfect preparation and technical organization of the conference. The next conference in this series, IFOS IV, is planned for the autumn of 1987, in Munster.
Die physikalischen und chemischen Eigenschaften einer Fest- koerperoberflache werden von ihrer Zusammensetzung im Bereich der obersten Atomlagen bestimmt. Eine moeglichst genaue Kennt- nis der chemischen Zusammensetzung der Festkoerperoberflache ist Voraussetzung fur das Verstandnis vieler technisch wich- tiger Bereiche wie z. B. Katalyse, Korrosion und Dunnschicht- technik. Ein Verfahren zur Oberflachenanalyse, das eine um- fassende Information uber diese Eigenschaften liefert, sollte daher folgende Forderungen erfullen: 1. Anwendbarkeit auf beliebige Proben 2. Informationstiefe im Bereich einer Monolage 3. Nachweis von Elementen und Verbindungen 4. Trennung von Isotopen 5. Hohe Empfindlichkeit 6. Hohes Aufloesungsvermoegen 7. Keine Diskriminierung bestimmter Komponenten 8. Keine Beinflussung der Oberflache durch den Analysenvorgang selbst Kein Verfahren zur Oberflachenanalyse kann alle diese Forderunger erfullen. Im Vergleich zu anderen Verfahren wie z. B. der Auger- Elektronen-Spektroskopie (AES) (1), der Photoelektronen-Spektros- kopie (ESCA) (2,3) oder der Ionenruckstreuung (ISS) (4) besitzt die Sekundarionen-Massenspektrometrie (SIMS) (5-8) jedoch folgende Vorteile: 1. Direkter Nachweis von chemischen Verbindungen, 2. Nachweis von Wasserstoff und seinen Verbindungen, 3. Trennung von Isotopen, 4. Hohe Empfindlichkeit fur viele Elemente und Verbindungen. Damit ist das SIMS-Verfahren insbesondere zur Untersuchung von monomolekularen Oberflachenschichten und Oberflachenreaktionen sowie zur Spurenanalyse geeignet. Ein wichtiger Nachteil des - 2 - Verfahrens ist jedoch die fur die einzelnen Elemente und Verbindungen um Groessenordnungen verschiedene Nachweis- empfindlichkeit, die zudem nicht nur von dem betreffenden Element bzw. der Verbindung selbst, sondern auch von dessen Umgebung, der "Matrix", abhangt.
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