|
Showing 1 - 3 of
3 matches in All Departments
This volume contains the proceedings of the Fifth International
Confer- ence on Secondary Ion Mass Spectrometry (SIMS V), held at
the Capitol Holiday Inn, Washington, DC, USA, from September 30 to
October 4, 1985. The conference was the fifth in a series of
conferences held bienni- ally. Previous conferences were held in
Miinster (1977), Stanford (1979), Budapest (1981), and Osaka
(1983). SIMS V was organized by Dr. R. J. Colton of the Nayal
Research Lab- oratory and Dr. D. S. Simons of the National Bureau
of Standards un- der the auspices of the International Organizing
Committee chaired by Prof. A. Benninghoven of the Universitat
Miinster. Dr. Richard F. K. Herzog served as the honorary chairman
of SIMS V. While Dr. Herzog is best known to the mass spectrometry
community for his theoretical development of a mass spectrometer
design, known as the Mattauch-Herzog geometry, he also made several
early and impor- tant contributions to SIMS. In 1949, Herzog and
Viehbock published a description of the first instrument designed
to study secondary ions pro- duced by bombardment from a beam of
ions generated in a source that was separated from the sample by a
narrow tube. Later at the GCA Cor- poration, he brought together a
team of researchers including H. J. Liebl, F. G. Riidenauer, W. P.
Poschenrieder and F. G. Satkiewicz, who designed and built, and
carried out applied research with the first commercial ion
microprobe.
The 3rd International Conference on Ion Formation from Organic
Solids (IFOS III) was held at the University of Munster, September
16-18, 1985. The conference was attended by 60 invited scientists
from all over the world. Of the 43 papers which were presented, 40
are included in these proceedings. The aim of IFOS III was to
promote the exchange of results and new ideas between scientists
actively working in the field of mass spectrometry of involatile
materials. Various aspects of the ion formation process -
realization and optimization, theoretical understanding and
analytical application -were treated, as well as instrumental
developments. Some emphasis was placed on recent developments in
time-of-flight and Fourier transform ion cyclotron resonance mass
spectrometry, and its impact on the mass spectrometry of involatile
materials. The most important goal of the conference was to combine
facets of the understanding of the most complex ion formation
processes with the many different aspects of its analytical
application. The participants came from a wide variety of different
fields, including pure and applied physics and chemistry, medicine,
pharmacy, and space research. Finally, on behalf of all the
conference participants, I would like to thank Dr. W. Sichtermann
and: \1iss I. Bekemeier for the perfect preparation and technical
organization of the conference. The next conference in this series,
IFOS IV, is planned for the autumn of 1987, in Munster.
Die physikalischen und chemischen Eigenschaften einer Fest-
koerperoberflache werden von ihrer Zusammensetzung im Bereich der
obersten Atomlagen bestimmt. Eine moeglichst genaue Kennt- nis der
chemischen Zusammensetzung der Festkoerperoberflache ist
Voraussetzung fur das Verstandnis vieler technisch wich- tiger
Bereiche wie z. B. Katalyse, Korrosion und Dunnschicht- technik.
Ein Verfahren zur Oberflachenanalyse, das eine um- fassende
Information uber diese Eigenschaften liefert, sollte daher folgende
Forderungen erfullen: 1. Anwendbarkeit auf beliebige Proben 2.
Informationstiefe im Bereich einer Monolage 3. Nachweis von
Elementen und Verbindungen 4. Trennung von Isotopen 5. Hohe
Empfindlichkeit 6. Hohes Aufloesungsvermoegen 7. Keine
Diskriminierung bestimmter Komponenten 8. Keine Beinflussung der
Oberflache durch den Analysenvorgang selbst Kein Verfahren zur
Oberflachenanalyse kann alle diese Forderunger erfullen. Im
Vergleich zu anderen Verfahren wie z. B. der Auger-
Elektronen-Spektroskopie (AES) (1), der Photoelektronen-Spektros-
kopie (ESCA) (2,3) oder der Ionenruckstreuung (ISS) (4) besitzt die
Sekundarionen-Massenspektrometrie (SIMS) (5-8) jedoch folgende
Vorteile: 1. Direkter Nachweis von chemischen Verbindungen, 2.
Nachweis von Wasserstoff und seinen Verbindungen, 3. Trennung von
Isotopen, 4. Hohe Empfindlichkeit fur viele Elemente und
Verbindungen. Damit ist das SIMS-Verfahren insbesondere zur
Untersuchung von monomolekularen Oberflachenschichten und
Oberflachenreaktionen sowie zur Spurenanalyse geeignet. Ein
wichtiger Nachteil des - 2 - Verfahrens ist jedoch die fur die
einzelnen Elemente und Verbindungen um Groessenordnungen
verschiedene Nachweis- empfindlichkeit, die zudem nicht nur von dem
betreffenden Element bzw. der Verbindung selbst, sondern auch von
dessen Umgebung, der "Matrix", abhangt.
|
You may like...
Loot
Nadine Gordimer
Paperback
(2)
R398
R330
Discovery Miles 3 300
Catan
(16)
R1,150
R887
Discovery Miles 8 870
|