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Imaging Spectroscopy for Scene Analysis (Hardcover, 2013 ed.): Antonio Robles-Kelly, Cong Phuoc Huynh Imaging Spectroscopy for Scene Analysis (Hardcover, 2013 ed.)
Antonio Robles-Kelly, Cong Phuoc Huynh
R4,126 R3,549 Discovery Miles 35 490 Save R577 (14%) Ships in 12 - 17 working days

In contrast with trichromatic image sensors, imaging spectroscopy can capture the properties of the materials in a scene. This implies that scene analysis using imaging spectroscopy has the capacity to robustly encode material signatures, infer object composition and recover photometric parameters.

This landmark text/reference presents a detailed analysis of spectral imaging, describing how it can be used in elegant and efficient ways for the purposes of material identification, object recognition and scene understanding. The opportunities and challenges of combining spatial and spectral information are explored in depth, as are a wide range of applications from surveillance and computational photography, to biosecurity and resource exploration.

Topics and features: discusses spectral image acquisition by hyperspectral cameras, and the process of spectral image formation; examines models of surface reflectance, the recovery of photometric invariants, and the estimation of the illuminant power spectrum from spectral imagery; describes spectrum representations for the interpolation of reflectance and radiance values, and the classification of spectra; reviews the use of imaging spectroscopy for material identification; explores the recovery of reflection geometry from image reflectance; investigates spectro-polarimetric imagery, and the recovery of object shape and material properties using polarimetric images captured from a single view.

An essential resource for researchers and graduate students of computer vision and pattern recognition, this comprehensive introduction to imaging spectroscopy for scene analysis will also be of great use to practitioners interested in shape analysis employing polarimetric imaging, and material recognition and classification using hyperspectral or multispectral data.

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2018, Beijing, China,... Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Paperback, 1st ed. 2018)
Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, …
R1,613 Discovery Miles 16 130 Ships in 10 - 15 working days

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.

Imaging Spectroscopy for Scene Analysis (Paperback, 2013 ed.): Antonio Robles-Kelly, Cong Phuoc Huynh Imaging Spectroscopy for Scene Analysis (Paperback, 2013 ed.)
Antonio Robles-Kelly, Cong Phuoc Huynh
R3,722 Discovery Miles 37 220 Ships in 10 - 15 working days

This book presents a detailed analysis of spectral imaging, describing how it can be used for the purposes of material identification, object recognition and scene understanding. The opportunities and challenges of combining spatial and spectral information are explored in depth, as are a wide range of applications. Features: discusses spectral image acquisition by hyperspectral cameras, and the process of spectral image formation; examines models of surface reflectance, the recovery of photometric invariants, and the estimation of the illuminant power spectrum from spectral imagery; describes spectrum representations for the interpolation of reflectance and radiance values, and the classification of spectra; reviews the use of imaging spectroscopy for material identification; explores the recovery of reflection geometry from image reflectance; investigates spectro-polarimetric imagery, and the recovery of object shape and material properties using polarimetric images captured from a single view.

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy,... Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings (Paperback, 1st ed. 2021)
Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly
R1,569 Discovery Miles 15 690 Ships in 10 - 15 working days

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico,... Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016, Proceedings (Paperback, 1st ed. 2016)
Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson
R3,266 Discovery Miles 32 660 Ships in 10 - 15 working days

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.

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