Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Paperback, 1st ed. 2018)

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Series:	Lecture Notes in Computer Science, 11004
Release date:	August 2018
First published:	2018
Editors:	Xiao Bai • Edwin R. Hancock • Tin Kam Ho • Richard C. Wilson • Battista Biggio • Antonio Robles-Kelly
Dimensions:	235 x 155mm (L x W)
Format:	Paperback
Pages:	524
Edition:	1st ed. 2018
ISBN-13:	978-3-319-97784-3
Categories:	Books > Science & Mathematics > Mathematics > General Books > Computing & IT > General theory of computing > Data structures Books > Computing & IT > Computer programming > Algorithms & procedures Books > Computing & IT > Applications of computing > Pattern recognition Books > Computing & IT > Applications of computing > Artificial intelligence > General Books > Computing & IT > Applications of computing > Image processing > General
LSN:	3-319-97784-9
Barcode:	9783319977843

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