This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume include papers on aberration corrected TEM & STEM, SEM - FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging associated with bio-nanotechnology, medical applications, host-pathogen interaction, etc. This book will be beneficial to researchers, educators, and practitioners alike.

This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume include papers on aberration corrected TEM & STEM, SEM - FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging associated with bio-nanotechnology, medical applications, host-pathogen interaction, etc. This book will be beneficial to researchers, educators, and practitioners alike.

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging-the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.