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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry (Hardcover, 1st ed. 2016) Loot Price: R3,110
Discovery Miles 31 100
You Save: R262 (8%)
Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry (Hardcover, 1st ed. 2016): C. Barry Carter, David B....

Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry (Hardcover, 1st ed. 2016)

C. Barry Carter, David B. Williams

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List price R3,372 Loot Price R3,110 Discovery Miles 31 100 | Repayment Terms: R291 pm x 12* You Save R262 (8%)

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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging-the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

General

Imprint: Springer International Publishing AG
Country of origin: Switzerland
Release date: September 2016
First published: 2016
Editors: C. Barry Carter • David B. Williams
Dimensions: 279 x 210 x 27mm (L x W x T)
Format: Hardcover
Pages: 518
Edition: 1st ed. 2016
ISBN-13: 978-3-319-26649-7
Categories: Books > Professional & Technical > Technology: general issues > Nanotechnology
Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 3-319-26649-7
Barcode: 9783319266497

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