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Charged Semiconductor Defects - Structure, Thermodynamics and Diffusion (Hardcover, 2009 ed.): Edmund G. Seebauer, Meredith C.... Charged Semiconductor Defects - Structure, Thermodynamics and Diffusion (Hardcover, 2009 ed.)
Edmund G. Seebauer, Meredith C. Kratzer
R4,043 Discovery Miles 40 430 Ships in 18 - 22 working days

Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of "defect engineering." For example, in the bulk, charging significantly affects the total concentration of defects that are available to mediate phenomena such as solid-state diffusion. Surface defects play an important role in mediating surface mass transport during high temperature processing steps such as epitaxial film deposition, diffusional smoothing in reflow, and nanostructure formation in memory device fabrication. "Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors. Features: group IV, III-V, and oxide semiconductors; intrinsic and extrinsic defects; and, point defects, as well as defect pairs, complexes and clusters.

Charged Semiconductor Defects - Structure, Thermodynamics and Diffusion (Paperback, Softcover reprint of hardcover 1st ed.... Charged Semiconductor Defects - Structure, Thermodynamics and Diffusion (Paperback, Softcover reprint of hardcover 1st ed. 2009)
Edmund G. Seebauer, Meredith C. Kratzer
R4,015 Discovery Miles 40 150 Ships in 18 - 22 working days

Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of "defect engineering." For example, in the bulk, charging significantly affects the total concentration of defects that are available to mediate phenomena such as solid-state diffusion. Surface defects play an important role in mediating surface mass transport during high temperature processing steps such as epitaxial film deposition, diffusional smoothing in reflow, and nanostructure formation in memory device fabrication. "Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors. Features: group IV, III-V, and oxide semiconductors; intrinsic and extrinsic defects; and, point defects, as well as defect pairs, complexes and clusters.

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