In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

VLSI CADhas greatly bene?ted from the use of reduced ordered Binary Decision Diagrams (BDDs) and the clausal representation as a problem of Boolean Satis?ability (SAT), e.g. in logic synthesis, ver- cation or design-for-testability. In recent practical applications, BDDs are optimized with respect to new objective functions for design space exploration. The latest trends show a growing number of proposals to fuse the concepts of BDD and SAT. This book gives a modern presentation of the established as well as of recent concepts. Latest results in BDD optimization are given, c- ering di?erent aspects of paths in BDDs and the use of e?cient lower bounds during optimization. The presented algorithms include Branch ? and Bound and the generic A -algorithm as e?cient techniques to - plore large search spaces. ? The A -algorithm originates from Arti?cial Intelligence (AI), and the EDA community has been unaware of this concept for a long time. Re- ? cently, the A -algorithm has been introduced as a new paradigm to explore design spaces in VLSI CAD. Besides AI search techniques, the book also discusses the relation to another ?eld of activity bordered to VLSI CAD and BDD optimization: the clausal representation as a SAT problem.

The size of technically producible integrated circuits increases continuously, but the ability to design and verify these circuits does not keep up. Therefore today 's design flow has to be improved. Using a visionary approach, this book analyzes the current design methodology and verification methodology, a number of deficiencies are identified and solutions suggested. Improvements in the methodology as well as in the underlying algorithms are proposed.

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

The size of technically producible integrated circuits increases continuously, but the ability to design and verify these circuits does not keep up. Therefore today 's design flow has to be improved. Using a visionary approach, this book analyzes the current design methodology and verification methodology, a number of deficiencies are identified and solutions suggested. Improvements in the methodology as well as in the underlying algorithms are proposed.

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

VLSI CADhas greatly bene?ted from the use of reduced ordered Binary Decision Diagrams (BDDs) and the clausal representation as a problem of Boolean Satis?ability (SAT), e.g. in logic synthesis, ver- cation or design-for-testability. In recent practical applications, BDDs are optimized with respect to new objective functions for design space exploration. The latest trends show a growing number of proposals to fuse the concepts of BDD and SAT. This book gives a modern presentation of the established as well as of recent concepts. Latest results in BDD optimization are given, c- ering di?erent aspects of paths in BDDs and the use of e?cient lower bounds during optimization. The presented algorithms include Branch ? and Bound and the generic A -algorithm as e?cient techniques to - plore large search spaces. ? The A -algorithm originates from Arti?cial Intelligence (AI), and the EDA community has been unaware of this concept for a long time. Re- ? cently, the A -algorithm has been introduced as a new paradigm to explore design spaces in VLSI CAD. Besides AI search techniques, the book also discusses the relation to another ?eld of activity bordered to VLSI CAD and BDD optimization: the clausal representation as a SAT problem.

Eingebettete Systeme ubernehmen zentrale Steueraufgaben im taglichen Leben. In der Energieversorgung oder im Transportwesen wurde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlasst sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstuchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.