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Silicene - Prediction, Synthesis, Application (Hardcover, 1st ed. 2018): Patrick Vogt, Guy Lelay Silicene - Prediction, Synthesis, Application (Hardcover, 1st ed. 2018)
Patrick Vogt, Guy Lelay
R4,264 Discovery Miles 42 640 Ships in 10 - 15 working days

This book discusses the processing and properties of silicene, including the historical and theoretical background of silicene, theoretical predictions, the synthesis and experimental properties of silicene and the potential applications and further developments. It also presents other similar monolayer materials, like germanene and phosphorene. Silicene, a new silicon allotrope with a graphene-like, honeycomb structure, has recently attracted considerable interest, because its topology affords it the same remarkable electronic properties as those of graphene. Additionally, silicene may have the potential advantage of being easily integrated in current Si-based nano/micro-electronics, offering novel technological applications. Silicene was theoretically conjectured a few years ago as a stand-alone material. However, it does not exist in nature and had to be synthesized on a substrate. It has since been successfully synthesized and multi-layer silicene structures are already being discussed. Within just a few years, silicene is now on the brink of technological applications in electronic devices.

Introduction to the Physics of Silicene and other 2D Materials (Paperback, 1st ed. 2017): Seymur Cahangirov, Hasan Sahin, Guy... Introduction to the Physics of Silicene and other 2D Materials (Paperback, 1st ed. 2017)
Seymur Cahangirov, Hasan Sahin, Guy Lelay, Angel Rubio
R1,708 Discovery Miles 17 080 Ships in 10 - 15 working days

This concise book offers an essential introduction and reference guide for the many newcomers to the field of physics of elemental 2D materials. Silicene and related materials are currently among the most actively studied materials, especially following the first experimental synthesis on substrates in 2012. Accordingly, this primer introduces and reviews the most crucial developments regarding silicene from both theoretical and experimental perspectives. At the same time the reader is guided through the extensive body of relevant foundational literature. The text starts with a brief history of silicene, followed by a comparison of the bonding nature in silicon versus carbon atoms. Here, a simple but robust framework is established to help the reader follow the concepts presented throughout the book. The book then presents the atomic and electronic structure of free-standing silicene, followed by an account of the experimental realization of silicene on substrates. This topic is subsequently developed further to discuss various reconstructions that silicene acquires due to interactions with the substrate and how such effects are mirrored in the electronic properties. Next the book examines the dumbbell structure that is the key to understanding the growth mechanism and atomic structure of multilayer silicene. Last but not least, it addresses similar effects in other elemental 2D materials from group IV (germanene, stanane), group V (phosphorene) and group III (borophene), as well as transition metal dichalcogenides and other compositions, so as to provide a general comparative overview of their electronic properties.

Semiconductor Interfaces: Formation and Properties - Proceedings of the Workkshop, Les Houches, France February 24-March 6,... Semiconductor Interfaces: Formation and Properties - Proceedings of the Workkshop, Les Houches, France February 24-March 6, 1987 (Paperback, Softcover reprint of the original 1st ed. 1987)
Guy Lelay, Jacques Derrien, Nino Boccara
R3,281 R505 Discovery Miles 5 050 Save R2,776 (85%) Ships in 9 - 15 working days

The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success."

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