|
Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
|
Buy Now
Semiconductor Interfaces: Formation and Properties - Proceedings of the Workkshop, Les Houches, France February 24-March 6, 1987 (Paperback, Softcover reprint of the original 1st ed. 1987)
Loot Price: R485
Discovery Miles 4 850
You Save: R2,668
(85%)
|
|
|
Semiconductor Interfaces: Formation and Properties - Proceedings of the Workkshop, Les Houches, France February 24-March 6, 1987 (Paperback, Softcover reprint of the original 1st ed. 1987)
Series: Springer Proceedings in Physics, 22
 (sign in to rate)
List price R3,153
Loot Price R485
Discovery Miles 4 850
You Save R2,668 (85%)
Expected to ship within 9 - 15 working days
|
The trend towards miniaturisation of microelectronic devices and
the search for exotic new optoelectronic devices based on
multilayers confer a crucial role on semiconductor interfaces.
Great advances have recently been achieved in the elaboration of
new thin film materials and in the characterization of their
interfacial properties, down to the atomic scale, thanks to the
development of sophisticated new techniques. This book is a
collection of lectures that were given at the International Winter
School on Semiconductor Interfaces: Formation and Properties held
at the Centre de Physique des Rouches from 24 February to 6 March,
1987. The aim of this Winter School was to present a comprehensive
review of this field, in particular of the materials and methods,
and to formulate recom mendations for future research. The
following topics are treated: (i) Interface formation. The key
aspects of molecular beam epitaxy are emphasized, as well as the
fabrication of artificially layered structures, strained layer
superlattices and the tailoring of abrupt doping profiles. (ii)
Fine characterization down to the atomic scale using recently devel
oped, powerful techniques such as scanning tunneling microscopy,
high reso lution transmission electron microscopy, glancing
incidence x-ray diffraction, x-ray standing waves, surface extended
x-ray absorption fine structure and surface extended energy-loss
fine structure. (iii) Specific physical properties of the
interfaces and their prospective applications in devices. We wish
to thank warmly all the lecturers and participants, as well as the
organizing committee, who made this Winter School a success."
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
You might also like..
|
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
