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This book addresses the challenges of designing high performance analog-to-digital converters (ADCs) based on the "smart data converters" concept, which implies context awareness, on-chip intelligence and adaptation. Readers will learn to exploit various information either a-priori or a-posteriori (obtained from devices, signals, applications or the ambient situations, etc.) for circuit and architecture optimization during the design phase or adaptation during operation, to enhance data converters performance, flexibility, robustness and power-efficiency. The authors focus on exploiting the a-priori knowledge of the system/application to develop enhancement techniques for ADCs, with particular emphasis on improving the power efficiency of high-speed and high-resolution ADCs for broadband multi-carrier systems.
Smart and Flexible Digital-to-Analog Converters proposes new concepts and implementations for flexibility and self-correction of current-steering digital-to-analog converters (DACs) which allow the attainment of a wide range of functional and performance specifications, with a much reduced dependence on the fabrication process. DAC linearity is analysed with respect to the accuracy of the DAC unit elements. A classification is proposed of the many different current-steering DAC correction methods. The classification reveals methods that do not yet exist in the open literature. Further, this book systematically analyses self-calibration correction methods for the various DAC mismatch errors. For instance, efficient calibration of DAC binary currents is identified as an important missing method. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties.< DAC linearity is analysed with respect to the accuracy of the DAC unit elements. A classification is proposed of the many different current-steering DAC correction methods. The classification reveals methods that do not yet exist in the open literature. Further, this book systematically analyses self-calibration correction methods for the various DAC mismatch errors. For instance, efficient calibration of DAC binary currents is identified as an important missing method. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties.
The history of the application of semiconductors for controlling currents goes back all the way to 1926, in which Julius Lilienfeld led a patent for a "Method and apparatus for controlling electric currents" [1], which is considered the rst work on metal/semiconductor eld-effect transistors. More well-known is the work of William Shockley, John Bardeen and Walter Brattain in the 1940s [2, 3], after which the development of semiconductor devices commenced. In 1958, independent work from Jack Kilby and Robert Noyce ledto the invention of integrated circuits. A few milestones in IC design are the rst monolithic operational ampli er in 1963 (Fairchild?A702, Bob Widlar) and the rst o- chip 4-bit microprocessor in 1971 (Intel 4004). Ever since the start of the semiconductor history, integration plays an imp- tant role: starting from single devices, ICs with basic functions were developed (e. g. opamps, logic gates), followed by ICs that integrate larger parts of a s- tem (e. g. microprocessors, radio tuners, audio ampli ers). Following this trend of system integration, this eventually leads to the integration of analog and d- ital components in one chip, resulting in mixed-signal ICs: digital components are required because signal processing is preferably done in the digital - main; analog components are required because physical signals are analog by nature. Mixed-signal ICs are already widespread in many applications (e. g. - dio, video); for the future, it is expected that this trend will continue, leading to a larger scale of integration.
This book addresses the challenges of designing high performance analog-to-digital converters (ADCs) based on the “smart data converters” concept, which implies context awareness, on-chip intelligence and adaptation. Readers will learn to exploit various information either a-priori or a-posteriori (obtained from devices, signals, applications or the ambient situations, etc.) for circuit and architecture optimization during the design phase or adaptation during operation, to enhance data converters performance, flexibility, robustness and power-efficiency. The authors focus on exploiting the a-priori knowledge of the system/application to develop enhancement techniques for ADCs, with particular emphasis on improving the power efficiency of high-speed and high-resolution ADCs for broadband multi-carrier systems.
Smart and Flexible Digital-to-Analog Converters proposes new concepts and implementations for flexibility and self-correction of current-steering digital-to-analog converters (DACs) which allow the attainment of a wide range of functional and performance specifications, with a much reduced dependence on the fabrication process. DAC linearity is analysed with respect to the accuracy of the DAC unit elements. A classification is proposed of the many different current-steering DAC correction methods. The classification reveals methods that do not yet exist in the open literature. Further, this book systematically analyses self-calibration correction methods for the various DAC mismatch errors. For instance, efficient calibration of DAC binary currents is identified as an important missing method. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties.< DAC linearity is analysed with respect to the accuracy of the DAC unit elements. A classification is proposed of the many different current-steering DAC correction methods. The classification reveals methods that do not yet exist in the open literature. Further, this book systematically analyses self-calibration correction methods for the various DAC mismatch errors. For instance, efficient calibration of DAC binary currents is identified as an important missing method. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties. This book goes on to propose a new methodology for correcting mismatch errors of both nominally identical unary as well as scaled binary DAC currents. A new concept for DAC flexibility is presented. The associated architecture is based on a modular design approach that uses parallel sub-DAC units to realize flexible design, functionality and performance. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties. Two main concepts, self-calibration and flexibility, are demonstrated in practice using three DAC testchips in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible Digital-to-Analog Converters will be useful to both advanced professionals and newcomers in the field. Advanced professionals will find new methods that are fully elaborated from analysis at conceptual level to measurement results at test-chip level. New comers in the field will find structured knowledge of fully referenced state-of-the art methods with many fully explained novelties.
The history of the application of semiconductors for controlling currents goes back all the way to 1926, in which Julius Lilienfeld led a patent for a "Method and apparatus for controlling electric currents" [1], which is considered the rst work on metal/semiconductor eld-effect transistors. More well-known is the work of William Shockley, John Bardeen and Walter Brattain in the 1940s [2, 3], after which the development of semiconductor devices commenced. In 1958, independent work from Jack Kilby and Robert Noyce ledto the invention of integrated circuits. A few milestones in IC design are the rst monolithic operational ampli er in 1963 (Fairchild?A702, Bob Widlar) and the rst o- chip 4-bit microprocessor in 1971 (Intel 4004). Ever since the start of the semiconductor history, integration plays an imp- tant role: starting from single devices, ICs with basic functions were developed (e. g. opamps, logic gates), followed by ICs that integrate larger parts of a s- tem (e. g. microprocessors, radio tuners, audio ampli ers). Following this trend of system integration, this eventually leads to the integration of analog and d- ital components in one chip, resulting in mixed-signal ICs: digital components are required because signal processing is preferably done in the digital - main; analog components are required because physical signals are analog by nature. Mixed-signal ICs are already widespread in many applications (e. g. - dio, video); for the future, it is expected that this trend will continue, leading to a larger scale of integration.
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