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Materials Reliability in Microelectronics III: Volume 309 (Paperback): Kenneth P. Rodbell, William F. Filter, Harold J. Frost,... Materials Reliability in Microelectronics III: Volume 309 (Paperback)
Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho
R809 Discovery Miles 8 090 Ships in 12 - 17 working days

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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