Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials. This volume is a comprehensive review of AFM techniques and their application in adhesion studies. It is intended for both researchers and students in engineering disciplines, physics and biology. Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.

This book chronicles the proceedings of the International Symposium on Apparent and Microscopic Contact Angles, held in conjunction with the American Chemical Society meeting in Boston, August 24--27, 1998. The symposium provided an opportunity to discuss several controversial issues associated with interfacial phenomena that govern the behavior of the three-phase systems. This volume contains 28 papers --- previously published in 3 issues of the Journal of Adhesion Science and Technology. The book is divided into four parts: Nanoscopic and Molecular Effects on Contact Angles; Surface Forces and Surface Free Energy; Wetting of Heterogeneous, Rough and Curved Surfaces; Dynamic Effects in Contact Angle Measurements. Among the topics covered are: contact line tension measurement; liquid drop surface topography; molecular mechanisms of hydrophobic transitions; stereochemical and conformational aspects of polymer surfaces; determination of acid-base properties of metal oxides and polymers by contact angle measurement; van Oss--Good theory of acid-base surface free energies; AFM measurement of forces; thin liquid films; wettability of flat and curved surfaces; contact angle hysteresis; factors affecting contact angle meassurements; dynamic wetting behavior; and effect of surfactants on wetting.

This book chronicles the proceedings of the International Symposium on Apparent and Microscopic Contact Angles, held in conjunction with the American Chemical Society meeting in Boston, August 24--27, 1998.
The symposium provided an opportunity to discuss several controversial issues associated with interfacial phenomena that govern the behavior of the three-phase systems. This volume contains 28 papers --- previously published in 3 issues of the Journal of Adhesion Science and Technology.
The book is divided into four parts: Nanoscopic and Molecular Effects on Contact Angles; Surface Forces and Surface Free Energy; Wetting of Heterogeneous, Rough and Curved Surfaces; Dynamic Effects in Contact Angle Measurements. Among the topics covered are: contact line tension measurement; liquid drop surface topography; molecular mechanisms of hydrophobic transitions; stereochemical and conformational aspects of polymer surfaces; determination of acid-base properties of metal oxides and polymers by contact angle measurement; van Oss--Good theory of acid-base surface free energies; AFM measurement of forces; thin liquid films; wettability of flat and curved surfaces; contact angle hysteresis; factors affecting contact angle meassurements; dynamic wetting behavior; and effect of surfactants on wetting.