Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
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Atomic Force Microscopy in Adhesion Studies (Hardcover)
Loot Price: R8,976
Discovery Miles 89 760
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Atomic Force Microscopy in Adhesion Studies (Hardcover)
Expected to ship within 12 - 17 working days
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Since its discovery, Atomic Force Microscopy (AFM) has become a
technique of choice for non-destructive surface characterization
with sub-molecular resolution. The AFM has also emerged as a
problem-solving tool in applications relevant to particle-solid and
particle-liquid interactions, design, fabrication, and
characterization of new materials, and development of new
technologies for processing and modification of materials. This
volume is a comprehensive review of AFM techniques and their
application in adhesion studies. It is intended for both
researchers and students in engineering disciplines, physics and
biology. Over 100 authors contributed to this book, summarizing
current status of research on measurements of colloidal
particle-solid adhesion and molecular forces, solid surface imaging
and mapping, and discussing the contact mechanics models applicable
to particle-substrate and particle-particle systems.
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