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Defect and Microstructure Analysis by Diffraction (Hardcover): Robert Snyder, Jaroslav Fiala, Hans J. Bunge Defect and Microstructure Analysis by Diffraction (Hardcover)
Robert Snyder, Jaroslav Fiala, Hans J. Bunge
R10,846 R9,594 Discovery Miles 95 940 Save R1,252 (12%) Ships in 12 - 17 working days

This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.

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