Defect and Microstructure Analysis by Diffraction (Hardcover)

This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.

General

Imprint:	Oxford UniversityPress
Country of origin:	United Kingdom
Series:	International Union of Crystallography Monographs on Crystallography, 10
Release date:	2001
First published:	March 2000
Editors:	Robert Snyder • Jaroslav Fiala (Department of Metallurgy) • Hans J. Bunge (Department of Physical Metallurgy)
Dimensions:	241 x 162 x 48mm (L x W x T)
Format:	Hardcover
Pages:	808
ISBN-13:	978-0-19-850189-3
Categories:	Books > Science & Mathematics > Chemistry > Crystallography
LSN:	0-19-850189-7
Barcode:	9780198501893

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