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Defect and Microstructure Analysis by Diffraction (Hardcover) Loot Price: R9,442
Discovery Miles 94 420
Defect and Microstructure Analysis by Diffraction (Hardcover): Robert Snyder, Jaroslav Fiala, Hans J. Bunge

Defect and Microstructure Analysis by Diffraction (Hardcover)

Robert Snyder, Jaroslav Fiala, Hans J. Bunge

Series: International Union of Crystallography Monographs on Crystallography, 10

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Loot Price R9,442 Discovery Miles 94 420 | Repayment Terms: R885 pm x 12*

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This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.

General

Imprint: Oxford UniversityPress
Country of origin: United Kingdom
Series: International Union of Crystallography Monographs on Crystallography, 10
Release date: 2000
First published: March 2000
Editors: Robert Snyder • Jaroslav Fiala (Department of Metallurgy) • Hans J. Bunge (Department of Physical Metallurgy)
Dimensions: 241 x 162 x 48mm (L x W x T)
Format: Hardcover
Pages: 808
ISBN-13: 978-0-19-850189-3
Categories: Books > Science & Mathematics > Chemistry > Crystallography
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LSN: 0-19-850189-7
Barcode: 9780198501893

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