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This book will introduce new techniques for detecting and
diagnosing small-delay defects in integrated circuits. Although
this sort of timing defect is commonly found in integrated circuits
manufactured with nanometer technology, this will be the first book
to introduce effective and scalable methodologies for screening and
diagnosing small-delay defects, including important parameters such
as process variations, crosstalk, and power supply noise.
This book will introduce new techniques for detecting and
diagnosing small-delay defects in integrated circuits. Although
this sort of timing defect is commonly found in integrated circuits
manufactured with nanometer technology, this will be the first book
to introduce effective and scalable methodologies for screening and
diagnosing small-delay defects, including important parameters such
as process variations, crosstalk, and power supply noise.
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