Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Provides an in-depth overview of flexible electronics from their applications, manufacturing processes, device characteristics, to circuit and system design solutions. With rapid advances in flexible semiconducting materials, the performance of TFT circuits has been improving significantly and concerns about their ambient stability have been alleviated to a great extent over the past few years. After a brief introduction to flexible electronics, the book highlights its key difference from silicon electronics, and the challenges and opportunities of circuit design for emerging applications such as wearable electronics, personalized healthcare, and flexible displays. While the main focus of the book is on the design, EDA and test issues, it also offers brief technical reviews on TFT technologies, manufacturing methods, and flexible photovoltaics for the purpose of providing a more comprehensive introduction of this emerging field.