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Showing 1 - 10 of 10 matches in All Departments
This book deals with the acquisition and extraction of the various morphological features of the electrocardiogram signals. In the first chapters the book first presents data fusion and different data mining techniques that have been used for the cardiac state diagnosis. The second part deals with heart rate variability (HRV), a non-invasive measurement of cardiovascular autonomic regulation. Next, visualization of ECG data is discussed, an important part of the display in life threatening state. Here, the handling of data is discussed which were acquired during several hours. In the following chapters the book discusses aortic pressure measurement which is of significant clinical importance. It presents non-invasive methods for analysis of the aortic pressure waveform, indicating how it can be employed to determine cardiac contractility, arterial compliance, and peripheral resistance. In addition, the book demonstrates methods to extract diagnostic parameters for assessing cardiac function. Further the measurement strategies for contractile effort of the left ventricle are presented. Finally, the book concludes about the future of cardiac signal processing leading to next generation research topics which directly impacts the cardiac health care. The editors thank Biocom Technologies for the provided scientific material and help in writing the book.
Contemporary African Literature in English explores the contours of representation in contemporary Anglophone African literature, drawing on a wide range of authors including Chimamanda Ngozi Adichie, Aminatta Forna, Brian Chikwava, Ngug? wa Thiong'o, Nuruddin Farah and Chris Abani.
Contemporary African Literature in English explores the contours of representation in contemporary Anglophone African literature, drawing on a wide range of authors including Chimamanda Ngozi Adichie, Aminatta Forna, Brian Chikwava, Ngug? wa Thiong'o, Nuruddin Farah and Chris Abani.
Chemical-mechanical planarization (CMP) has emerged over the past few years as a key enabling technology in the relentless drive of the semiconductor industry towards smaller, faster and less expensive interconnects. However, there are still many gaps in the fundamental understanding of the overall CMP process and the associated defect and contamination issues. This book brings together many of the active players in the field to focus on the interdisciplinary nature of these challenges. It reflects, to some extent, the role played by both academic institutions and multinational corporations in opening up the frontiers in the field of CMP for wider dissemination. Both experimental and theoretical contributions are included. Topics include: overview and oxide polishing; pads and related issues; metal polishing - W and Al; copper polishing and related issues; CMP modeling and fluid flow; and particle adhesion and post-polish cleaning.
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
The innovation management classic returns for today's fully digitized world When legendary business thought leaders C.K. Prahalad and M.S. Krishnan first published The New Age of Innovation, the book was instantly lauded as one of the most forward-looking business guides of the year. Now, ten years later, their predictions that advanced technologies would transform every business in every industry have been borne out. And their lessons for managing the software revolution are more critical today than ever. The New Age of Innovation provides the insights and practices you need to drive profits and growth in today's interconnected, software-dominated world-a world where companies partner with customers to create value. You'll learn how to: *Align all software systems within your company *Measure individual behavior using smart analytics *Continuously improve customer-facing and back-end processes *Make every stakeholder a unique partner in your mission *Work seamlessly across cultures and time-zones *Create teams that drive high-quality, low-cost solutions The ubiquity of software and digitization introduce valuable opportunities for personalized value creation and global resource partnership. Manage them well and you'll seize the competitive edge in no time. The New Age of Innovation provides everything you need to by leveraging the tools at your disposal to transform their business and dominate your industry.
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Students and researchers looking for a comprehensive textbook on magnetism, magnetic materials and related applications will find in this book an excellent explanation of the field. Chapters progress logically from the physics of magnetism, to magnetic phenomena in materials, to size and dimensionality effects, to applications. Beginning with a description of magnetic phenomena and measurements on a macroscopic scale, the book then presents discussions of intrinsic and phenomenological concepts of magnetism such as electronic magnetic moments and classical, quantum, and band theories of magnetic behavior. It then covers ordered magnetic materials (emphasizing their structure-sensitive properties) and magnetic phenomena, including magnetic anisotropy, magnetostriction, and magnetic domain structures and dynamics. What follows is a comprehensive description of imaging methods to resolve magnetic microstructures (domains) along with an introduction to micromagnetic modeling. The book then explores in detail size (small particles) and dimensionality (surface and interfaces) effects - the underpinnings of nanoscience and nanotechnology that are brought into sharp focus by magnetism. The hallmark of modern science is its interdisciplinarity, and the second half of the book offers interdisciplinary discussions of information technology, magnetoelectronics and the future of biomedicine via recent developments in magnetism. Modern materials with tailored properties require careful synthetic and characterization strategies. The book also includes relevant details of the chemical synthesis of small particles and the physical deposition of ultra thin films. In addition, the book presents details of state-of-the-art characterization methods and summaries of representative families of materials, including tables of properties. CGS equivalents (to SI) are included.
Students and researchers looking for a comprehensive textbook on magnetism, magnetic materials and related applications will find in this book an excellent explanation of the field. Chapters progress logically from the physics of magnetism, to magnetic phenomena in materials, to size and dimensionality effects, to applications. Beginning with a description of magnetic phenomena and measurements on a macroscopic scale, the book then presents discussions of intrinsic and phenomenological concepts of magnetism such as electronic magnetic moments and classical, quantum, and band theories of magnetic behavior. It then covers ordered magnetic materials (emphasizing their structure-sensitive properties) and magnetic phenomena, including magnetic anisotropy, magnetostriction, and magnetic domain structures and dynamics. What follows is a comprehensive description of imaging methods to resolve magnetic microstructures (domains) along with an introduction to micromagnetic modeling. The book then explores in detail size (small particles) and dimensionality (surface and interfaces) effects - the underpinnings of nanoscience and nanotechnology that are brought into sharp focus by magnetism. The hallmark of modern science is its interdisciplinarity, and the second half of the book offers interdisciplinary discussions of information technology, magnetoelectronics and the future of biomedicine via recent developments in magnetism. Modern materials with tailored properties require careful synthetic and characterization strategies. The book also includes relevant details of the chemical synthesis of small particles and the physical deposition of ultra thin films. In addition, the book presents details of state-of-the-art characterization methods and summaries of representative families of materials, including tables of properties. CGS equivalents (to SI) are included.
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