Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.

Es ist heute nahezu unmAglich, die Aoebersicht A1/4ber die verschiedenen therapeutischen Angebote fA1/4r kArperbehinderte Kinder zu behalten. A"rzte, Therapeuten und Lehrer sind meist A1/4berfordert, wenn sie den betroffenen Eltern umfassende Auskunft darA1/4ber geben sollen. Dieses Buch ist ein Wegweiser zu den gAngigsten TherapiemAglichkeiten. Von fA1/4hrenden Vertretern der einzelnen Verfahren - von der Vojtamethode A1/4ber das Bobathprinzip, von der Manuellen Medizin A1/4ber die Ergotherapie zur LogopAdie, Hilfsmittelversorgung Operationsplanung usw. - werden A1/4ber 20 Verfahren vorgestellt und bewertet. Auch die kritischen Fragen zu Wirksamkeitsnachweisen und Kosten der oft lebenslangen Therapie werden behandelt. Die inhaltlich homogen gegliederten Kapitel erlauben einen raschen und detaillierten Aoeberblick.

This is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. ++++ The below data was compiled from various identification fields in the bibliographic record of this title. This data is provided as an additional tool in helping to ensure edition identification: ++++ Comparatio Gymnasii Portensis In Superiori Saxonia Cum Paedagogio Ilfeldensi In Saxonia Inferiori Succincta Commentatione Instituta Johann M. Riedel Coeler, 1726