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Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry

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Secondary Ion Mass Spectrometry SIMS III - Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 (Paperback, Softcover reprint of the original 1st ed. 1982) Loot Price: R3,009
Discovery Miles 30 090
Secondary Ion Mass Spectrometry SIMS III - Proceedings of the Third International Conference, Technical University, Budapest,...

Secondary Ion Mass Spectrometry SIMS III - Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 (Paperback, Softcover reprint of the original 1st ed. 1982)

A. Benninghoven, J. Giber, J. Laszlo, M. Riedel, H.W. Werner

Series: Springer Series in Chemical Physics, 19

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Loot Price R3,009 Discovery Miles 30 090 | Repayment Terms: R282 pm x 12*

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Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Chemical Physics, 19
Release date: July 2012
First published: 1982
Editors: A. Benninghoven • J. Giber • J. Laszlo • M. Riedel • H.W. Werner
Dimensions: 235 x 155 x 24mm (L x W x T)
Format: Paperback
Pages: 447
Edition: Softcover reprint of the original 1st ed. 1982
ISBN-13: 978-3-642-88154-1
Categories: Books > Science & Mathematics > Physics > States of matter > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 3-642-88154-8
Barcode: 9783642881541

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