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Atom Probe Field Ion Microscopy (Hardcover): M.K. Miller, A. Cerezo, M.G. Hetherington, G. D. W. Smith FRS Atom Probe Field Ion Microscopy (Hardcover)
M.K. Miller, A. Cerezo, M.G. Hetherington, G. D. W. Smith FRS
R6,688 Discovery Miles 66 880 Ships in 10 - 15 working days

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

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