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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Atom Probe Field Ion Microscopy (Hardcover) Loot Price: R6,688
Discovery Miles 66 880
Repayment Terms: R627 pm x 12*
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Atom Probe Field Ion Microscopy (Hardcover): M.K. Miller, A. Cerezo, M.G. Hetherington, G. D. W. Smith FRS

Atom Probe Field Ion Microscopy (Hardcover)

M.K. Miller, A. Cerezo, M.G. Hetherington, G. D. W. Smith FRS

Series: Monographs on the Physics and Chemistry of Materials, 52

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Loot Price R6,688 Discovery Miles 66 880 | Repayment Terms: R627 pm x 12*

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This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

General

Imprint: Clarendon Press
Country of origin: United Kingdom
Series: Monographs on the Physics and Chemistry of Materials, 52
Release date: September 1996
First published: November 1996
Authors: M.K. Miller (Metals and Ceramics Division) • A. Cerezo (Department of Materials) • M.G. Hetherington • G. D. W. Smith FRS (Professor Of Materials Science, Department of Materials)
Dimensions: 242 x 164 x 33mm (L x W x T)
Format: Hardcover
Pages: 520
ISBN-13: 978-0-19-851387-2
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
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LSN: 0-19-851387-9
Barcode: 9780198513872

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