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VLSI Circuit Simulation and Optimization (Hardcover, 1996 ed.): V. Litovski, Mark Zwolinski VLSI Circuit Simulation and Optimization (Hardcover, 1996 ed.)
V. Litovski, Mark Zwolinski
R6,019 Discovery Miles 60 190 Ships in 18 - 22 working days

Circuit simulation has become an essential tool in circuit design and without it's aid, analogue and mixed-signal IC design would be impossible. However the applicability and limitations of circuit simulators have not been generally well understood and this book now provides a clear and easy to follow explanation of their function. The material covered includes the algorithms used in circuit simulation and the numerical techniques needed for linear and non-linear DC analysis, transient analysis and AC analysis. The book goes on to explain the numeric methods to include sensitivity and tolerance analysis and optimisation of component values for circuit design. The final part deals with logic simulation and mixed-signal simulation algorithms. There are comprehensive and detailed descriptions of the numerical methods and the material is presented in a way that provides for the needs of both experienced engineers who wish to extend their knowledge of current tools and techniques, and of advanced students and researchers who wish to develop new simulators.

VLSI Design and Test - 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Paperback, 2013... VLSI Design and Test - 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Paperback, 2013 ed.)
Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, …
R2,428 Discovery Miles 24 280 Ships in 18 - 22 working days

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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