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VLSI Design and Test - 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Paperback, 2013 ed.)
Loot Price: R2,577
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VLSI Design and Test - 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Paperback, 2013 ed.)
Series: Communications in Computer and Information Science, 382
Expected to ship within 10 - 15 working days
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This book constitutes the refereed proceedings of the 17th
International Symposium on VLSI Design and Test, VDAT 2013, held in
Jaipur, India, in July 2013. The 44 papers presented were carefully
reviewed and selected from 162 submissions. The papers discuss the
frontiers of design and test of VLSI components, circuits and
systems. They are organized in topical sections on VLSI design,
testing and verification, embedded systems, emerging technology.
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