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VLSI Design and Test - 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Paperback, 2013 ed.) Loot Price: R2,458
Discovery Miles 24 580
VLSI Design and Test - 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Paperback, 2013...

VLSI Design and Test - 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings (Paperback, 2013 ed.)

Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh

Series: Communications in Computer and Information Science, 382

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Loot Price R2,458 Discovery Miles 24 580 | Repayment Terms: R230 pm x 12*

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This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Communications in Computer and Information Science, 382
Release date: December 2013
First published: 2013
Editors: Manoj Singh Gaur • Mark Zwolinski • Vijay Laxmi • D. Boolchandani • Virendra Sing • Adit Singh
Dimensions: 235 x 155 x 21mm (L x W x T)
Format: Paperback
Pages: 388
Edition: 2013 ed.
ISBN-13: 978-3-642-42023-8
Categories: Books > Computing & IT > Internet > Network computers
Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General
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LSN: 3-642-42023-0
Barcode: 9783642420238

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