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Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 2nd ed. 2010): Otwin... Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 2nd ed. 2010)
Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp
R4,087 R3,028 Discovery Miles 30 280 Save R1,059 (26%) Ships in 10 - 15 working days

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

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