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Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 2nd ed. 2010) Loot Price: R2,683
Discovery Miles 26 830
Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 2nd ed. 2010): Otwin...

Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials (Hardcover, 2nd ed. 2010)

Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp

Series: Springer Series in Advanced Microelectronics, 10

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Loot Price R2,683 Discovery Miles 26 830 | Repayment Terms: R251 pm x 12*

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This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Advanced Microelectronics, 10
Release date: September 2010
First published: 2010
Authors: Otwin Breitenstein • Wilhelm Warta • Martin Langenkamp
Dimensions: 235 x 155 x 20mm (L x W x T)
Format: Hardcover
Pages: 258
Edition: 2nd ed. 2010
ISBN-13: 978-3-642-02416-0
Categories: Books > Science & Mathematics > Physics > Optics (light)
Books > Professional & Technical > Technology: general issues > Engineering: general
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
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LSN: 3-642-02416-5
Barcode: 9783642024160

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