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Yield and Reliability in Microwave Circuit and System Design (Hardcover): Michael D. Meehan, John Purviance Yield and Reliability in Microwave Circuit and System Design (Hardcover)
Michael D. Meehan, John Purviance
R2,479 Discovery Miles 24 790 Ships in 18 - 22 working days

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

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