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Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)

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Yield and Reliability in Microwave Circuit and System Design (Hardcover) Loot Price: R2,479
Discovery Miles 24 790
Repayment Terms: R232 pm x 12*
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Yield and Reliability in Microwave Circuit and System Design (Hardcover): Michael D. Meehan, John Purviance

Yield and Reliability in Microwave Circuit and System Design (Hardcover)

Michael D. Meehan, John Purviance

Series: Microwave Library

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Loot Price R2,479 Discovery Miles 24 790 | Repayment Terms: R232 pm x 12*

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This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

General

Imprint: Artech House Publishers
Country of origin: United States
Series: Microwave Library
Release date: December 1993
First published: December 1993
Authors: Michael D. Meehan • John Purviance
Dimensions: 229 x 152 x 20mm (L x W x T)
Format: Hardcover - Laminated cover
Pages: 300
ISBN-13: 978-0-89006-527-3
Categories: Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
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LSN: 0-89006-527-6
Barcode: 9780890065273

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