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Electromagnetic Compatibility of Integrated Circuits - Techniques for low emission and susceptibility (Paperback, 2006 ed.):... Electromagnetic Compatibility of Integrated Circuits - Techniques for low emission and susceptibility (Paperback, 2006 ed.)
Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
R4,063 Discovery Miles 40 630 Ships in 18 - 22 working days

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.

Electromagnetic Compatibility of Integrated Circuits - Techniques for low emission and susceptibility (Hardcover, 2006): Sonia... Electromagnetic Compatibility of Integrated Circuits - Techniques for low emission and susceptibility (Hardcover, 2006)
Sonia Ben Dhia, Mohamed Ramdani, Etienne Sicard
R4,271 Discovery Miles 42 710 Ships in 18 - 22 working days

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. The companion CD-ROM includes software illustrating key aspects of the book and a collection of demo tools applicable to EMC analysis of ICs.

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