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The importance of real space imaging and spatially-resolved
spectroscopy in many of the most significant problems of surface
and interface behaviour is almost self evident. To join the
expertise of the tradi tional surface scientist with that of the
electron microscopist has however been a slow and difficult
process. In the past few years remarkable progress has been
achieved, including the development of new techniques of scanning
transmission and reflection imaging as well as low energy
microscopy, all carried out in greatly improved vacuum conditions.
Most astonishing of all has been the advent of the scanning
tunneling electron microscope providing atomic resolution in a
manner readily compatible with most surface science diagnostic
procedures. The problem of beam damage, though often serious, is
increasingly well understood so that we can assess the reliability
and usefulness of the results which can now be obtained in
catalysis studies and a wide range of surface science applications.
These new developments and many others in more established surface
techniques are all described in this book, based on lectures given
at a NATO Advanced Study Institute held in Erice, Sicily, at Easter
1987. It is regretted that a few lectures on low energy electron
diffraction and channeling effects could not be included. Fifteen
lecturers from seven different Countries and 67 students from 23
Countries and a wide variety of backgrounds attended the school.
The Advanced Study Institute provided an opportunity for
researchers in universities, industry and National and
International Laboratories, from the disciplines ofmaterials
science, physics, chemistry and engineering to meet together in an
assessment of the impact of electron and scanning probe microscopy
on advanced material research. Since these researchers have
traditionally relied upon different approaches, due to their
different scientific background, to advanced materials problem
solving, presentations and discussion within the Institute sessions
were initially devoted to developing a set ofmutually understood
basic concepts, inherently related to different techniques
ofcharacterization by microscopy and spectroscopy. Particular
importance was placed on Electron Energy Loss Spectroscopy (EELS),
Scanning Probe Microscopy (SPM), High Resolution Transmission and
Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental
Scanning Electron Microscopy (ESEM). It was recognized that the
electronic structure derived directly from EELS analysis as well as
from atomic positions in HRTEM or High Angle Annular Dark Field
STEM can be used to understand the macroscopic behaviour of
materials. The emphasis, however, was upon the analysis of the
electronic band structure of grain boundaries, fundamental for the
understanding of macroscopic quantities such as strength, cohesion,
plasticity, etc.
The Advanced Study Institute provided an opportunity for
researchers in universities, industry and National and
International Laboratories, from the disciplines ofmaterials
science, physics, chemistry and engineering to meet together in an
assessment of the impact of electron and scanning probe microscopy
on advanced material research. Since these researchers have
traditionally relied upon different approaches, due to their
different scientific background, to advanced materials problem
solving, presentations and discussion within the Institute sessions
were initially devoted to developing a set ofmutually understood
basic concepts, inherently related to different techniques
ofcharacterization by microscopy and spectroscopy. Particular
importance was placed on Electron Energy Loss Spectroscopy (EELS),
Scanning Probe Microscopy (SPM), High Resolution Transmission and
Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental
Scanning Electron Microscopy (ESEM). It was recognized that the
electronic structure derived directly from EELS analysis as well as
from atomic positions in HRTEM or High Angle Annular Dark Field
STEM can be used to understand the macroscopic behaviour of
materials. The emphasis, however, was upon the analysis of the
electronic band structure of grain boundaries, fundamental for the
understanding of macroscopic quantities such as strength, cohesion,
plasticity, etc.
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