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Scan Statistics - Methods and Applications (Hardcover, 2009 ed.): Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein Scan Statistics - Methods and Applications (Hardcover, 2009 ed.)
Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein
R4,701 Discovery Miles 47 010 Ships in 10 - 15 working days

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

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