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Scan Statistics - Methods and Applications (Hardcover, 2009 ed.) Loot Price: R4,500
Discovery Miles 45 000
Scan Statistics - Methods and Applications (Hardcover, 2009 ed.): Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein

Scan Statistics - Methods and Applications (Hardcover, 2009 ed.)

Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein

Series: Statistics for Industry and Technology

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Loot Price R4,500 Discovery Miles 45 000 | Repayment Terms: R422 pm x 12*

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Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

General

Imprint: Birkhauser Boston
Country of origin: United States
Series: Statistics for Industry and Technology
Release date: May 2009
First published: 2009
Editors: Joseph Glaz • Vladimir Pozdnyakov • Sylvan Wallenstein
Dimensions: 254 x 178 x 35mm (L x W x T)
Format: Hardcover
Pages: 394
Edition: 2009 ed.
ISBN-13: 978-0-8176-4748-3
Categories: Books > Science & Mathematics > Mathematics > Probability & statistics
LSN: 0-8176-4748-1
Barcode: 9780817647483

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