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The original scope of the annual conference on industrial
applications of x-ray analysis envisioned almost total
participation by representatives from industrial laboratories_
These people were concerned with problems of an immediate nature
and thus welcomed the opportunity to meet for a few days with
associates from other laboratnries in order to discuss problems of
a similar nature, as weH as to interchange information freely and
rapidly_ Certainly, this was true during the first few years of the
conference's existence. During the past few years, however, a
rather subtle blending has occur red of representatives from
industrial laboratories, universities, and manu facturers of x-ray
equipment. Papers which deal with the fundamental as pects of some
phase of x-ray research and which, in many cases, have no end or
ultimate objective, are as eagerly received by the conferees as are
papers which deal with a specific problem of immediate importance
or a paper in which the la test equipment available is portrayed.
In our opinion, this x-ray conference, while perhaps no longer
slanted specificaHy toward industrial applications of x-ray
techniques, does continue to serve the same purpose as a medium of
interchange of the latest available information and at the same
time provide an opportunity for basic researchers, applied
researchers and manufacturing representatives to become acquainted
with each other's problems.
The Ninth Annual Conference on Applications of X-Ray Anal ysis
sponsored by the University of Denver was held August 10, 11,12,
1960, at the Park Lane Hotel in Denver, Colorado. Forty one papers
on new developments in X-ray analytical techniques and
instrumentation were presented. This volume contains thirty eight
of those papers. Research in X-ray analytical methods is a dynamic
and expanding area of scientific investigation. Each year exciting
and stimulating progress is reported in the various regions of this
field. Suitable documentation of the results is the purpose of the
series "Advances in X-Ray Analysis. " Participation in the
Conference by two distinguished European scientists, Dr. Raymond
Castaing of the University of Paris, France, and Dr. Arnold
Hargreaves of the Manchester College of Science and Technology,
England, was made possible through financial aid provided by the
United States Office of Naval Re search. This assistance is greatly
appreciated. Major contributions to the conference were made by the
following individuals who chaired the technical sessions: Dr.
William D. Forgeng, Electro Metallurgical Company, Niagara Falls,
New York Dr. Kurt F. J. Heinrich, E. I. du Pont de Nemours and
Company, Wilmington, Delaware Mr. Robert A. McCune, University of
Denver, Denver, Colorado Dr. Dan McLachlan, Jr. , Stanford Research
Institute, Menlo Park, California Dr. William H. Robinson, Carnegie
Institute of Technology, Pittsburgh, Pennsylvania Dr.
Consider for a few moments the staggering magnitude of
technological advance which has occurred since the birth four
centuries ago of that early progenitor of the scientific method,
Galileo. Think also about the extent of scientific knowledge avail
able during the lifetime of Galileo and his associates; knowledge
increasing slowly through several centuries, accelerating rapidly
during the past twenty years, culminat ing at the present time in a
virtual impossibility that one person - one communit- possibly even
one nation - can hope to generate or use productively more than a
minute portion of the world's scientific knowledge. New
developments - expanded technological concepts - occur with
dazzling rapidity, often faster than they can be assimilated. At
the same time there are practical limitations to the extent of
formal education. Continuing education, upgrading of scientific
know-how, retraining to assure full utilization of existing
knowledge - these are urgent problems which today confront the
nation's scientific community. And there is never enough time. The
problem is compounded by the increasing burden of information
retrieval.
The text of this volume had its origin in the Tenth Annual
Conference on Applications of X-Ray Analysis sponsored by the
University of Denver and held August 7,8,9, 1961, at the Albany
Hotel in Denver, Colorado. Approximately 300 participants derived
benefit from the presentation of fifty-six papers on new scientific
and technological developments in X-ray methods and the discussions
that followed. Forty-eight of these papers plus one presented at
the Ninth Con ference and cleared for publication too late to be
included in Volume 4 are given here. The growth of the annual
conferences and the breadth and intensity of the presentations are
confirmations of the observation that the field of X-ray re search
is indeed in a state of rapid and healthy development. Financial
assistance provided by the United States Office of Naval Research
permitted the participation oftwo distinguished scientists from
Europe, Professor Andre Guinier of the University of Paris and
Professor Hans Nowotny of the University of Vienna.
The papers presented in this volume of Advances in X-Ray Analysis
were chosen from those presented at the Fourteenth Annual
Conference on the Applications of X-Ray Analysis. This conference,
sponsored by the Metallurgy Division of the Denver Research
Institute, University of Denver, was held on August 24,25, and 26,
1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers
presented at the conference, 46 are included in this volume; also
included is an open discussion held on the effects of chemical com
bination on X-ray spectra. The subjects presented represent a broad
scope of applications of X-rays to a variety of fields and
disciplines. These included such fields as electron-probe
microanalysis, the effect of chemical combination on X-ray spectra,
and the uses of soft and ultrasoft X-rays in emission analysis.
Also included were sessions on X-ray diffraction and fluor escence
analysis. There were several papers on special topics, including
X-ray topography and X-ray absorption fine-structure analysis.
William L. Baun contributed considerable effort toward the
conference by organizing the session on the effect of chemical
combination on X-ray spectra fine structure. A special session was
established through the excellent efforts of S. P. Ong on the uses
and applica tions of soft X-rays in fluorescent analysis. We offer
our sincere thanks to these men, for these two special sessions
contributed greatly to the success of the conference.
The torrential flow of technical information appearing in the world
sources of literature is creating concern and apprehension among
scientific people at all levels. It is extremely difficult to keep
abreast of information flowing into a specific field. It is nearly
impossible to transcend traditional confines of individual
disciplines and put to effective use all pertinent information
which stems from continuously increased trans disciplinary
research. At the same time the researcher is faced with problems of
in creasing complexity, with the requirement for new knowledge and
new techniques, and must frequently, with little time, bridge the
gap between his own sphere of experience and a sometimes apparently
unrelated new interest. This is readily observed with X-ray
analysis, where the chemist, physicist, metallurgist, and engineer
are each faced with the solution of problems peculiar to specific
disciplines but where solutions frequently correlate with the
particular needs of the others. The Annual Conference on
Applications of X-Ray Analysis and the subsequent Advances in X-Ray
Analysis contribute to better understanding of multidisciplinary
accomplishments; they are a ready source of information for the
researcher who must undertake an abrupt change in emphasis for new
objectives. The scope of this conference is broad--concerning
itself, as it does, with latest developments in high-temperature
and cryogenic techniques, phase equilibria, crystal structures,
polymers, microprobes, and new developments in instrumentation.
A real need exists for ways to bridge the gap between basic
research and prac tical application, for faster utilization of new
discoveries and new developments in the world of technology, and
for technical transfer of defense and space accomplish ments to the
civilian economy. The problem is compounded by the torrential flow
of technical information. Thirty million books are available on
technical subjects, the total increasing at the rate of six hundred
every day. There are one hundred thousand technical journals. More
scientific work has been published in the past ten years than in
all preceding recorded history. Scientists and engineers only a few
years beyond academic pursuits are already encountering a
continuing need for retraining and expansion of their own
knowledge. At the same time, the re searchers - scientists,
engineers, students - must exhibit bold creative thinking to evolve
new technology, to better understand nature's secrets, to conceive
new theories, and to reduce old theories to practical utilization.
Research in the physical sciences and the engineering sciences
provides the ever-flowing spring of knowledge for the investigation
of new ideas. Such research is sometimes hindered by classification
as "basic" or "applied. " There are many times when a research
program has no immediate or ultimate objective and is truly
contributing to our reservoir of knowledge - a reservoir which will
certainly be tapped in the future.
It is interesting to observe the ever increasing versatility of
X-ray analysis as evidenced by the wide range of application to the
myriads of problems confronting the technological com munity, a
versatility limited only by the imagination and inge nuity of the
scientist, the designer of X-ray equipment, and the novice or
student. Tomorrow's engineering alloys will undoubt edly be
influenced by today's extremely low- and very high-tem perature
X-ray research. New and continued insight into the basic
architecture of crystalline materials is being achieved by studies
of lattice imperfection, recrystallization habit, and phase
transformation. Techniques for identification and analysis of
minerals by X-ray diffraction and fluorescence are equally ame
nable to pathological and physiological diagnosis. The experi
mental setup of this month may well become an instrument for
routine process control next month. And such developments occur so
rapidly iIi so many different laboratories that it is difficult to
keep abreast of this tidal wave of information. The dictates of
this nation's economy and its struggle for technological supremacy
demand a full awareness of the ac complishments of one's
associates. Such awareness is most effectively obtained through
personal contact. where the beginner can benefit from the
experiences of the expert, the basic re searcher and the applied
researcher can exchange views, and the creative research of each is
nurtured by the sharing of mutual or associated problems.
Contributing Authors Are Paul Lublin, Charles G. Dodd, P. William
Zingaro, And Many Others.
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