Advances in X-Ray Analysis - Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7-9, 1961 (Paperback, Softcover reprint of the original 1st ed. 1962)

The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado. Approximately 300 participants derived benefit from the presentation of fifty-six papers on new scientific and technological developments in X-ray methods and the discussions that followed. Forty-eight of these papers plus one presented at the Ninth Con ference and cleared for publication too late to be included in Volume 4 are given here. The growth of the annual conferences and the breadth and intensity of the presentations are confirmations of the observation that the field of X-ray re search is indeed in a state of rapid and healthy development. Financial assistance provided by the United States Office of Naval Research permitted the participation oftwo distinguished scientists from Europe, Professor Andre Guinier of the University of Paris and Professor Hans Nowotny of the University of Vienna.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Series:	Advances in X-Ray Analysis, 5
Release date:	August 2014
First published:	1962
Authors:	William M. Mueller
Dimensions:	254 x 178 x 30mm (L x W x T)
Format:	Paperback
Pages:	564
Edition:	Softcover reprint of the original 1st ed. 1962
ISBN-13:	978-1-4684-7608-8
Categories:	Books > Science & Mathematics > Chemistry > Physical chemistry > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > General Promotions
LSN:	1-4684-7608-4
Barcode:	9781468476088

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