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Rapid Reliability Assessment of VLSICs (Paperback, Softcover reprint of the original 1st ed. 1990)
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Rapid Reliability Assessment of VLSICs (Paperback, Softcover reprint of the original 1st ed. 1990)
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The increasing application of integrated circuits in situations
where high reliability is needed places a requirement on the
manufacturer to use methods of testing to eliminate devices that
may fail on service. One possible approach that is described in
this book is to make precise electrical measurements that may
reveal those devices more likely to fail. The measurements assessed
are of analog circuit parameters which, based on a knowledge of
failure mechanisms, may indicate a future failure. . To incorporate
these tests into the functional listing of very large scale
integrated circuits consideration has to be given to the
sensitivity of the tests where small numbers of devices may be
defective in a complex circuit. In addition the tests ideally
should require minimal extra test time. A range of tests has been
evaluated and compared with simulation used to assess the
sensitivity of the measurements. Other work in the field is fully
referenced at the end of each chapter. The team at Lancaster
responsible for this book wish to thank the Alvey directorate and
SERe for the necessary support and encouragement to publish our
results. We would also like to thank John Henderson, recently
retired from the British Telecom Research Laboratories, for his
cheerful and enthusiastic encouragement. Trevor Ingham, now in New
Zealand, is thanked for his early work on the project.
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