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Books > Professional & Technical > Technology: general issues > Instruments & instrumentation engineering > Engineering measurement & calibration

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Introduction to Semiconductor Device Yield Modeling (Hardcover, New) Loot Price: R2,422
Discovery Miles 24 220
Introduction to Semiconductor Device Yield Modeling (Hardcover, New): Albert V.Ferris- Prabhu

Introduction to Semiconductor Device Yield Modeling (Hardcover, New)

Albert V.Ferris- Prabhu

Series: Electronic Materials & Devices Library

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Loot Price R2,422 Discovery Miles 24 220 | Repayment Terms: R227 pm x 12*

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This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.

General

Imprint: Artech House Publishers
Country of origin: United States
Series: Electronic Materials & Devices Library
Release date: July 2002
First published: July 1992
Authors: Albert V.Ferris- Prabhu
Dimensions: 229 x 152 x 9mm (L x W x T)
Format: Hardcover - Laminated cover
Pages: 108
Edition: New
ISBN-13: 978-0-89006-450-4
Categories: Books > Professional & Technical > Technology: general issues > Instruments & instrumentation engineering > Engineering measurement & calibration
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
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LSN: 0-89006-450-4
Barcode: 9780890064504

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