As the requirements of the semiconductor industry have become more
demanding in terms of resolution and speed it has been necessary to
push photoresist materials far beyond the capabilities previously
envisioned. Currently there is significant worldwide research
effort in to so called Next Generation Lithography techniques such
as EUV lithography and multibeam electron beam lithography. These
developments in both the industrial and the academic lithography
arenas have led to the proliferation of numerous novel approaches
to resist chemistry and ingenious extensions of traditional
photopolymers. Currently most texts in this area focus on either
lithography with perhaps one or two chapters on resists, or on
traditional resist materials with relatively little consideration
of new approaches. This book therefore aims to bring together the
worlds foremost resist development scientists from the various
community to produce in one place a definitive description of the
many approaches to lithography fabrication.
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