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Emerging Technologies and Circuits (Hardcover, 2010 ed.)
Loot Price: R4,318
Discovery Miles 43 180
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Emerging Technologies and Circuits (Hardcover, 2010 ed.)
Series: Lecture Notes in Electrical Engineering, 66
Expected to ship within 12 - 17 working days
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With the semiconductor market growth, new Integrated Circuit
designs are pushing the limit of the technology and in some cases,
require speci?c ?ne-tuning of certain process modules in
manufacturing. Thus the communities of design and technology are
increasingly intertwined. The issues that require close
interactions and colla- ration for trade-off and optimization
across the design/device/process ?elds are addressed in this book.
It contains a set of outstanding papers, keynote and tutorials
presented during 3 days at the International Conference on
Integrated Circuit Design and Technology (ICICDT) held in June 2008
in Minatec, Grenoble. The selected papers are spread over ?ve
chapters covering various aspects of emerging technologies and
devices, advanced circuit design, reliability, variability issues
and solutions, advanced memories and analog and mixed signals. All
these papers are focusing on design and technology interactions and
comply with the scope of the conference. v . Contents Part I
Introduction 1 Synergy Between Design and Technology: A Key Factor
in the Evolving Microelectronic Landscape. . . . . . . . . . . . .
. . . . . . . . . 3 Michel Brilloue]t Part II Emerging Technologies
and Circuits 2 New State Variable Opportunities Beyond CMOS: A
System Perspective . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . 17 Victor V. Zhirnov, Ralph K. Cavin, and George I.
Bourianoff 3 A Simple Compact Model to Analyze the Impact of
Ballistic and Quasi-Ballistic Transport on Ring Oscillator
Performance. . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . 37 S. Martinie, D. Munteanu, G. Le Carval, and J. L. Autran
Part III Advanced Devices and Circuits 4 Low-Voltage Scaled 6T
FinFET SRAM Cells . . . . . . . . . . . . . . . . . . . 55 N.
Collaert, K. von Arnim, R. Rooyackers, T."
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