This book contains proposals to redesign the scanning electron
microscope, so that it is more compatible with other charged
particle beam instrumentation and analytical techniques commonly
used in surface science research. It emphasizes the concepts
underlying spectrometer designs in the scanning electron
microscope, and spectrometers are discussed under one common
framework so that their relative strengths and weaknesses can be
more readily appreciated. This is done, for the most part, through
simulations and derivations carried out by the author himself.
The book is aimed at scientists, engineers and graduate
students whose research area or study in some way involves the
scanning electron microscope and/or charged particle spectrometers.
It can be used both as an introduction to these subjects and as a
guide to more advanced topics about scanning electron microscope
redesign.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!