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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs (Hardcover, 2014 ed.) Loot Price: R3,398
Discovery Miles 33 980
Repayment Terms: R318 pm x 12*
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Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs (Hardcover, 2014 ed.): Brandon Noia, Krishnendu...

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs (Hardcover, 2014 ed.)

Brandon Noia, Krishnendu Chakrabarty

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List price R3,699 Loot Price R3,398 Discovery Miles 33 980 | Repayment Terms: R318 pm x 12* You Save R301 (8%)

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This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

General

Imprint: Springer International Publishing AG
Country of origin: Switzerland
Release date: December 2013
First published: 2014
Authors: Brandon Noia • Krishnendu Chakrabarty
Dimensions: 235 x 155 x 16mm (L x W x T)
Format: Hardcover
Pages: 245
Edition: 2014 ed.
ISBN-13: 978-3-319-02377-9
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 3-319-02377-2
Barcode: 9783319023779

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