X-Ray Scattering (Hardcover)

X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. In this book, the authors present current research in the study of X-ray scattering, including real-time synchrotron X-ray scattering, applications of X-ray scattering in edible lipid systems; X-ray scattering of bacterial cell wall compounds and their neutralization and small angle X-ray scattering analysis of nanomaterials for ultra large scale integrated circuits.

General

Imprint:	nova science publishers
Country of origin:	United States
Release date:	2012
First published:	November 2011
Authors:	Christopher M Bauwens
Dimensions:	180 x 260 x 20mm (L x W x T)
Format:	Hardcover
Pages:	247
ISBN-13:	978-1-61324-326-8
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
LSN:	1-61324-326-X
Barcode:	9781613243268

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