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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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X-Ray Absorption Spectroscopy of Semiconductors (Hardcover, 2015 ed.) Loot Price: R3,705
Discovery Miles 37 050
You Save: R570 (13%)
X-Ray Absorption Spectroscopy of Semiconductors (Hardcover, 2015 ed.): Claudia S. Schnohr, Mark C. Ridgway

X-Ray Absorption Spectroscopy of Semiconductors (Hardcover, 2015 ed.)

Claudia S. Schnohr, Mark C. Ridgway

Series: Springer Series in Optical Sciences, 190

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List price R4,275 Loot Price R3,705 Discovery Miles 37 050 | Repayment Terms: R347 pm x 12* You Save R570 (13%)

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X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Optical Sciences, 190
Release date: November 2014
First published: 2015
Editors: Claudia S. Schnohr • Mark C. Ridgway
Dimensions: 235 x 155 x 23mm (L x W x T)
Format: Hardcover
Pages: 361
Edition: 2015 ed.
ISBN-13: 978-3-662-44361-3
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
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LSN: 3-662-44361-9
Barcode: 9783662443613

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