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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact (Hardcover, 1st ed. 2018) Loot Price: R4,659
Discovery Miles 46 590
Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact...

Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact (Hardcover, 1st ed. 2018)

Cor Claeys, Eddy Simoen

Series: Springer Series in Materials Science, 270

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Loot Price R4,659 Discovery Miles 46 590 | Repayment Terms: R437 pm x 12*

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This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

General

Imprint: Springer International Publishing AG
Country of origin: Switzerland
Series: Springer Series in Materials Science, 270
Release date: August 2018
First published: 2018
Authors: Cor Claeys • Eddy Simoen
Dimensions: 235 x 155mm (L x W)
Format: Hardcover
Pages: 438
Edition: 1st ed. 2018
ISBN-13: 978-3-319-93924-7
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
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LSN: 3-319-93924-6
Barcode: 9783319939247

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