|
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
|
Buy Now
Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact (Hardcover, 1st ed. 2018)
Loot Price: R4,951
Discovery Miles 49 510
|
|
|
Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact (Hardcover, 1st ed. 2018)
Series: Springer Series in Materials Science, 270
Expected to ship within 12 - 19 working days
|
This book provides a unique review of various aspects of metallic
contamination in Si and Ge-based semiconductors. It discusses all
of the important metals including their origin during crystal
and/or device manufacturing, their fundamental properties, their
characterization techniques and their impact on electrical devices'
performance. Several control and possible gettering approaches are
addressed. The book offers a valuable reference guide for all
researchers and engineers studying advanced and state-of-the-art
micro- and nano-electronic semiconductor devices and circuits.
Adopting an interdisciplinary approach, it combines perspectives
from e.g. material science, defect engineering, device processing,
defect and device characterization, and device physics and
engineering.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
You might also like..
|
Email address subscribed successfully.
A activation email has been sent to you.
Please click the link in that email to activate your subscription.
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
